EWU Institutional Repository

Browsing Department of Electronics and Communications Engineering by Subject "Optical Characterization of Thin Film"

Browsing Department of Electronics and Communications Engineering by Subject "Optical Characterization of Thin Film"

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  • Rahman, Afshania (East West University, 8/12/2014)
    In this work, thin film of Al and Zno has been developed on microscopic glass substrate using EDWARD thermal vacuum evaporator. The thickness of the deposit films was measured using surface stylus profilometer Dektak-150. ...

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