EWU Institutional Repository

Analytical Modeling of Silicon Nanowire Transistor - Effect of Width Variation

Show simple item record

dc.contributor.author Ahmed, Rokhsana
dc.contributor.author Mahmud, Ruhana Parvin
dc.date.accessioned 2018-09-25T09:56:40Z
dc.date.available 2018-09-25T09:56:40Z
dc.date.issued 5/11/2015
dc.identifier.uri http://dspace.ewubd.edu/handle/2525/2735
dc.description This thesis submitted in partial fulfillment of the requirements for the degree of B.Sc in Electrical and Electronic Engineering of East West University, Dhaka, Bangladesh. en_US
dc.description.abstract The effect of width variation of a Silicon nanowire MOSFET is studied in this work. We considered a ballistic gate-all-around Silicon nanowire MOSFET. The eigen energies of the time independent Schrodinger’s equation were found by solving the Bessel’s function. The eigen energies were used to find the drain current. We have used an analytical compact model to calculate the drain current. The effect of width variation on the drain current, transfer characteristics, transconductance, subthreshold swing, saturation current and saturation current density of the device are investigated. According to our observation the subthreshold swing decreases and the peak of transconductance increases as the wire widens. Saturation current increases with increase in width. Increase in saturation current density with decrease in wire width is an important motivation for choosing narrow wires in MOSFETs. en_US
dc.language.iso en_US en_US
dc.publisher East West University en_US
dc.relation.ispartofseries ;EEE00146
dc.subject Analytical Modeling of Silicon Nanowire Transistor, Width Variation en_US
dc.title Analytical Modeling of Silicon Nanowire Transistor - Effect of Width Variation en_US
dc.type Thesis en_US


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search DSpace


Advanced Search

Browse

My Account